Laser diode characterization
General laser diode measurements such as LI, spectrum, temperature dependence, polarization, IV, etc. are done using a specially designed probe station impedance matched for short pulsed testing. Translational stages allow for precise placement of a variety of optical components for quick adaptation allowing a variety of different measurements. Available equipment includes ILX Lightwave LDP-3840 & LDP-3811 Pulsed Current Sources, ILX LDT-5810B Temperature Controller, ILX OMM-6810B Optical Multimeter with Si (400-1100 nm) & InGaAs (950-1650 nm) Power/Waveheads, Keithley 2400 Source Meter for IV, & an Ando AQ-6315 Optical Spectrum Analyzer. A cleaving station with translational stages & a diamond tip is also available for cleaving laser bars as short as 200 microns with accuracy within 10 microns.


High-speeding testing
The high-speed lab is equipped with a probe station comprised of high-speed probes and detectors (25 GHz), electrical sources (3 GHz), a sampling oscilloscope, a network analyzer and a light-wave signal analyzer. These allow testing of devices for high speed applications such as optical interconnects, as well as extraction of device operating parameters for better understanding of their performance.

Low-temperature probe station

A TTP4 cryogenic manipulated-proble station is used for non-destructive electrical testing of devices on full and partial wafers up to 2 inches in diameter. Cryogenic operation is based on a continuous-tranfer cryogenic refrigerator specifically for the TTP. The station has a custom designed window and double-fiber optical probe, and the temperature can be varied from 4.2 K to 300 K.
Time-resolved electroluminescence
A time-resolved luminescence spectroscopy system equipped with one GaAs PMT, one InGaAs PMT, and three MCT detectors allows measurements in the wavelength range of 0.3 microns to 12 microns. The system is capable of measuring time-resolved photoluminescence and electroluminescence from 10 K to 400 K with nano second resolution. This system is designed to be integrated with our low-temperature probe station.
Integration sphere
The integrating sphere collects external radiation from an optical source or device (such as a laser or a light emitting diode) usually for the purpose of flux measurement. Radiation introduced into an integrating sphere is dispersed very uniformly at the sphere walls. The resulting integrated radiation level is directly proportional to the initial radiation level and can be directly measured by a detector.
NOTICE: All equipment is available to external users at reasonable cost.
Please e-mail for further details.