Temperature and power-dependent photoluminescence
The photoluminescence setup is currently equipped with a 50 mW HeNe laser and a 100 mW semiconductor laser as pump light sources. The spectrometer is equipped with a photomultiplier tube (PMT) and a Ge detector for spectral measurements in the range of 400 nm to 1700 nm. A cryostat enables temperature photoluminescence measurements ranging from 8 K to 320 K.
>>setup diagram and instruction<<
   

Transmittance and reflectance measurement
A Fourier Transform Infrared Spectrometer (FTIR) equipped with an InGaAs detector, an InSb detector, and an MCT detector is capable of measuring transmittance and reflectance for a wavelength range of 1 to 25 micron.
   
Time-resolved luminescence
A time-resolved luminescence spectroscopy system equipped with one GaAs PMT, one InGaAs PMT, and three MCT detectors allows measurements in the wavelength range of 0.3 microns to 12 microns. The system is capable of measuring time-resolved photoluminescence and electroluminescence from 10 K to 400 K with nano second resolution.
   
 
 
Material Characterization
 
The Center of Solid State Science (CSSS) here at ASU allows materials characterization, including transmission electron microscopy (TEM), scanning electron microscopy (SEM) Secondary Ion Mass Spectrometry (SIMS), Atomic Force Microscopy (AFM), and X-ray measurements.
 
List of facilities from LeRoy Eyring Center for Solid State Science (CSSS)
High resolution X-Ray Diffractometer
Optical Microscopy Lab

• Olympus BH2-UMA optical microscope

• Mititoyo Ultraplan FS-110 optical microscope

• Infinivar Depth-of-Field optical microscope

• Hamamatsu Infrared Reflectography system

Auger Electron Spectroscopy (AES)
XPS Surface Analysis
Gaertner L125B Ellipsometer
Quantum Design MPMS-5S SQUID Magnetometer
Scanning Probe Microscopy
FT-IR and FT-Raman spectroscopy
Raman spectroscopy
Secondary Ion Mass Spectrometer (SIMS)
Ion Beam Analysis of Materials
High Resolution Electron Microscopy

• FEI Nova 200 - SEM/FIB

• FEI Tecnai F20 - TEM/STEM

• FEI XL30 - EFSEM

• JEOL JEM 2000FX - TEM

• JEOL JEM 4000EX - TEM

• JEOL JEM-2010F - TEM/STEM

• JEOL JSM-840 - SEM

• LEO 912-Omega - TEM

• Philips CM200-FEG - TEM/STEM

• Philips EM400ST-FEF - TEM/STEM

• TOPCON 002B - TEM

 
 
NOTICE: All equipment is available to external users at reasonable cost.
Please e-mail yhzhang@asu.edu for further details.