Solar

 

Temperature and power-dependent photoluminescence
The photoluminescence setup was recently equiped with a new CCD array detector for measurements in the 200 nm to 1100 nm wavelength range, as well as an InGaAs array for measurements in the 800 nm to 1700 nm wavelength range.  Four different lasers are currently used in this system: A 6 W 532 nm diode pumped solid state laser, a 40 mW 532 diode pumped solid state laser, a 120 mW 405 nm laser and a tunable Ti:Sapphire laser. A cryostat enables temperature photoluminescence measurements ranging from 8 K to 320 K.
>>setup diagram and instruction<<
   

Transmittance and reflectance measurement

A Fourier Transform Infrared Spectrometer (FTIR) equipped with an InGaAs detector, an InSb detector, and an MCT detector is capable of measuring transmittance and reflectance for a wavelength range of 1 to 15 micron.
>>setup diagram and summary<<
   
Time-resolved luminescence
A time-resolved luminescence spectroscopy system equipped with one GaAs PMT, one InGaAs PMT, and three MCT detectors allows measurements in the wavelength range of 0.3 microns to 12 microns. The system is capable of measuring time-resolved photoluminescence and electroluminescence from 10 K to 400 K with nano second resolution.
   
 
 
Material Characterization
 
The Center of Solid State Science (CSSS) here at ASU allows materials characterization, including transmission electron microscopy (TEM), scanning electron microscopy (SEM) Secondary Ion Mass Spectrometry (SIMS), Atomic Force Microscopy (AFM), and X-ray measurements.
 
List of facilities from LeRoy Eyring Center for Solid State Science (CSSS)
High resolution X-Ray Diffractometer
Optical Microscopy Lab

Olympus BH2-UMA optical microscope

Mititoyo Ultraplan FS-110 optical microscope

Infinivar Depth-of-Field optical microscope

Hamamatsu Infrared Reflectography system

Auger Electron Spectroscopy (AES)
XPS Surface Analysis
Gaertner L125B Ellipsometer
Quantum Design MPMS-5S SQUID Magnetometer
Scanning Probe Microscopy
FT-IR and FT-Raman spectroscopy
Raman spectroscopy
Secondary Ion Mass Spectrometer (SIMS)
Ion Beam Analysis of Materials
High Resolution Electron Microscopy

FEI Nova 200 - SEM/FIB

FEI Tecnai F20 - TEM/STEM

FEI XL30 - EFSEM

JEOL JEM 2000FX - TEM

JEOL JEM 4000EX - TEM

JEOL JEM-2010F - TEM/STEM

JEOL JSM-840 - SEM

LEO 912-Omega - TEM

Philips CM200-FEG - TEM/STEM

Philips EM400ST-FEF - TEM/STEM

TOPCON 002B - TEM

 
 
NOTICE: All equipment is available to external users at reasonable cost.
Please e-mail yhzhang@asu.edu for further details.